Filmetrics announces the launch of its thin-film photovoltaic (TFPV) dedicated measurement systems. With the release of the F10-PV and the F37-PV Filmetrics now offers commercially available tabletop and in-line metrology solutions for industries utilizing all classes of TFPV materials.
Typically built on or under transparent conductive oxides (TCO) on glass, plastics, or metal substrates, the properties of TFPV films are notoriously difficult to measure due to their special optical properties. Filmetrics has SOLVED this problem for all classes of films used in today’s industry.
The Filmetrics F10-PV and F37-PV products are capable of monitoring the film thickness of active layers such as amorphous Si, CdS, CdTe, copper-indium gallium diselenide (CIGS), TCOs, and buffer layers. These types of devices are intentionally designed to absorb rather than reflect light creating many unique challenges for performing metrology on these layers. Surmounting these challenges the F10-PV and the F37-PV can accurately measure the thickness and optical properties of even the most complex structures on TCOs adding unrivalled value in terms of production quality, efficiency, and cost control for TFPV device manufacturers.
Strong market demand, and working closely with our existing TFPV customer base, led Filmetrics to undergo extensive collaborative research in the past months to develop these products. The addition of non-destructive thin-film thickness metrology to the TFPV environment is expected to greatly enhance production efficiency and yields, help develop new processes, and facilitate rapid transfer these new ideas to the production floor.
With years of experience in the thin-film measurement field, Filmetrics provides a simple-to-understand user interface and unparalleled support. Headquartered in San Diego, CA, Filmetrics has a full line of thin-film measurement systems and is continually developing new products and technologies that bring greater efficiency to thin-film metrology. Filmetrics was founded in 1995 and has quickly established itself as the foremost innovator in the thin-film measurement industry.